Temperature of Joule heated silicon microwire and nanowire measured by localized coating of quantum dots > International Conference | Mint - Mint Lab KAIST

KAIST MINT LAB

PUBLICATIONS

Home
PUBLICATIONS
International Conference

International Conference

At KAIST Temperature of Joule heated silicon microwire and nanowire measured by localized coating of quantum dots

본문

Author: J. Yun, J-H. Ahn, B. Lee, D-I. Moon, Y-K. Choi and I. Park

Conference: ASME Micro/Nanoscale Heat and Mass Transfer International Conference

Location: Singapore

Period: Jan 2016

목록

이전글Flexible and stretchable transducers based on functional nano composites 24.12.02
다음글Polyaniline-polystyrene nanofibers directly written on paper substrate by electrospinning, a low-cost and highly sensitive hydregen sulfide gas sensor 24.12.02