Deep Learning-based Gas Distribution Mapping for Hazardous Gas Leakage Detection and Localization using MEMS-based Semiconductor Metal Oxide Gas Sensors > Domestic Conference | Mint - Mint Lab KAIST

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Deep Learning-based Gas Distribution Mapping for Hazardous Gas Leakage Detection and Localization using MEMS-based Semiconductor Metal Oxide Gas Sensors

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Author: Taehwan Kim, Mingu Kang, Kichul Lee, Inkyu Park*

Conference: KMEMS 2023

Location: Jeju

Period: Mar 2023

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